Restricted Research - Award List, Note/Discussion Page
Fiscal Year: 2023
2138 The University of Texas at Dallas (144026)
Principal Investigator: Akin,Bilal
Total Amount of Contract, Award, or Gift (Annual before 2011): $ 253,628
Exceeds $250,000 (Is it flagged?): Yes
Start and End Dates: 1/1/23 - 12/31/23
Restricted Research: YES
Academic Discipline: Electrical & Computer Engr
Department, Center, School, or Institute: ECS
Title of Contract, Award, or Gift: Task 3160.020 Transient Reliability and Condition Monitoring of GaN HEMTs
Name of Granting or Contracting Agency/Entity:
Semiconductor Research Corp
Program Title: none
Note:
The main contribution is to leverage the overall efficiency and reliability of the GaN based power converters which are the key components in consumer electronics, power supplies and data centers. We will also develop condition monitoring systems for the same to enable uninterrupted operations. First objective of this research proposal is to address the 2 main challenges in transient reliability evaluation of GaN devices by (a) Developing a highly scalable dynamic high temperature operating life (DHTOL) test setup to perform transient reliability evaluation studies on large batches of GaN product test vehicles. Implement localized closed-loop heating techniques to generate high temperature test conditions for the GaN devices during testing .Localization of heating is crucial to prevent non-GaN failures in the converter circuit that may otherwise mask GaN device weaknesses and limit product level testing (b) Developing on-board characterization circuits and techniques for dynamic on-state resistance measurement. The aim is to exceed the requirements setout in JEP173 with a target speed of <100ns. On-board efficiency measurement circuits will also be developed for comprehensive characterization during testing. Additionally, characterization will also be performed under typical application scenarios to track aging and determine end-of-life.
Discussion: No discussion notes